<p style="text-align: justify">&nbsp; As a key physical parameter in annular flow, the thickness of liquid film is of great significance to study the behavior characteristics of gas-liquid interface under annular flow conditions. In this study, a vertical narrow rectangular channel was used as the research object, and air-water were used as the media to conduct annular flow experiments under atmospheric pressure. The cross-sectional area of the narrow rectangular channel is 70mm×2mm. &nbsp;PCB liquid film sensor is used to conduct multi-point measurement of the liquid film thickness. A total of 10×16 measuring points are arranged in rows and columns on the surface of the channel with a spatial resolution of 4.4mm×4.4mm and a measurement speed of 1000 frames per second. The results show that the thickness of the base film is between 100 microns and 300 microns. The randomness of the disturbance wave is enhanced by increasing the superficial liquid velocity. The average thickness of the liquid film decreases and the regular enhancement of the disturbance wave with the increase of the superficial gas velocity. The average thickness, wavelength and height of the disturbance wave increase with the increase of the superficial liquid velocity. Compared with the superficial gas velocity, the superficial liquid velocity has more significant influence on the film thickness</p>

Experimental Study on Measurement of Annular Flow Film Thickness in Vertical Narrow Rectangular Channel

Paper Proceedings: https://asmedigitalcollection.asme.org/ICONE/ICONE28/volume/85246

2021 28th International Conference on Nuclear Engineering (ICONE28)

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