In-Situ Laser-Based Process Monitoring and In-Plane Surface Anomaly Identification for Additive Manufacturing Using Point Cloud and Machine Learning

Jiaqi Lyu

Javid Akhavan Taheri Boroujeni

Souran Manoochehri

0 views
0 downloads

Powered byMorressier logo black

Discover more research and events on morressier.com