Conductive atomic force microscopy (CAFM) is an important and widely-used surface characterization tool. It is generally accepted that a nanoscale water meniscus could form between the CAFM tip and the substrate through condesation of ambient water vapor. This meniscus significantly increase the electrical current during the CAFM imaging. Here we show that in addition to water, adventitious airborne hydrocarbons also contribute to the formation of the liquid meniscus between the CAFM tip and graphite. The adsorption of adventitious airborne hydrocarbon alters the electrical current measured during the CAFM experiment, increaseing it at low relative humidity conditions and reducing it under high relative humidity conditions.

Adventitious airborne contamination and its impact on conductive atomic force microscopy

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