Depth profiling of metal-organic frameworks by Ar gas cluster ion beam (Ar1000-2500+): Effect of energy density (E/n) and Ar+ cosputter

Pochun Hsieh

Peng-Hsuan Chiang

Jing-Jong Shyue

0 views
0 downloads

Powered byMorressier logo black

Discover more research and events on morressier.com